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A Highly Scalable, Modular Test Bench Architecture for Large-Scale DC Power Cycling of SiC MOSFETs: Towards Data Enabled Reliability

March 1, 2021 by Bhanu Teja Vankayalapati, Fei Yang, Shi Pu, Masoud Farhadi, and Bilal Akin

©SHUTTERSTOCK.COM/VIKTORIA KURPAS

Silicon carbide (SiC) power MOSFETs have superior conduction, switching and thermal properties compared to silicon (Si) MOSFETs and IGBTs [1]. However, unlike Si devices, whose reliability is well understood from decades of research and field data, SiC device technology is relatively nascent and has only recently started witnessing wide scale deployment. This reliability challenge can possibly be addressed through two complementary solutions as shown in Figure 1: 1) developing a large accelerated aging dataset of SiC devices under various conditions to understand their long term reliability and guide future device development, 2) using on-board, in-system prognostics and device health monitoring techniques to predict imminent device failures well ahead of time, thus ensuring reliable system operation [2].

For more about this article see link below.
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https://ieeexplore.ieee.org/document/9359913

Filed Under: Past Features Tagged With: Accelerated aging, MOSFET, Reliability, Semiconductor device modeling, Silicon, Silicon carbide, Thermal conductivity

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IEEE Power Electronics Magazine publishes peer-reviewed articles related to power electronics and its applications which encompass the effective use of electronic components, application of control theory and circuit design techniques, and the development of analytical tools used in efficient and effective energy conversion, control, utilization, and conditioning of electric power.

The IEEE Power Electronics Magazine is limited to the field of interest of the IEEE Power Electronics Society. Topics also include publication of new trend technologies that are being pursued by industry, design practices and case studies, significant amount of state of the art surveys tutorials, and non-technical contributions: news about society activities, interviews, and historical articles.

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To educate, inform, and entertain our community of IEEE Power Electronics Society members on technology, events, industry news, and general topics relating to consumer electronics and to further serve and support our Members in professional career development through tutorials and raising awareness of engineering tools and technologies.

The magazine is archived in IEEE Xplore, and articles from all issues are available for download.

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