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Reliability

Expert View: GaN Outperforms Silicon, Enters Mainstream

June 1, 2021 by Balu Balakrishnan

Photo of Balu Balakrishnan

How does one define ‘main- stream’? In the case of gallium nitride (GaN) power semiconductor technology, we believe that since you can now buy a sleek, 65 W mobile charger using GaN for under $25 on Amazon, it is reasonable to assume that it has been fully accepted by the consumer markets, which—almost by definition—makes it a mainstream product. For more about this … [Read more...] about Expert View: GaN Outperforms Silicon, Enters Mainstream

Reliability of Silicon Battery Technology and Power Electronics Based Energy Conversion

June 1, 2021 by Sandra Hansen, Frederik Hahn, Helge Krüger, Felix Hoffmann, Markus Andresen, Rainer Adelung, and Marco Liserre

Image of purple circles with a golden border.

Continuous improvements in battery technology has paved the way for adoption in growing number of applications. However, the state-of-the-art graphite anodes remain sensitive to heat dissipation during fast charging or short circuits, and possibly causing inflammation of the battery. This is a limitation for safety critical applications and prevents ultra-high charging rates. … [Read more...] about Reliability of Silicon Battery Technology and Power Electronics Based Energy Conversion

A Highly Scalable, Modular Test Bench Architecture for Large-Scale DC Power Cycling of SiC MOSFETs: Towards Data Enabled Reliability

March 1, 2021 by Bhanu Teja Vankayalapati, Fei Yang, Shi Pu, Masoud Farhadi, and Bilal Akin

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Silicon carbide (SiC) power MOSFETs have superior conduction, switching and thermal properties compared to silicon (Si) MOSFETs and IGBTs [1]. However, unlike Si devices, whose reliability is well understood from decades of research and field data, SiC device technology is relatively nascent and has only recently started witnessing wide scale deployment. This reliability … [Read more...] about A Highly Scalable, Modular Test Bench Architecture for Large-Scale DC Power Cycling of SiC MOSFETs: Towards Data Enabled Reliability

Towards Intelligent Power Electronics-Dominated Grid via Machine Learning Techniques

March 1, 2021 by Omar H. Abu-Rub, Amin Y. Fard, Muhammad Farooq Umar, Mohsen Hosseinzadehtaher, and Mohammad B. Shadmand

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Nowadays, to meet the vision of employing 100% renewable-based electricity generation, the conventional power system is evolving into power electronics-dominated grid (PEDG). This transition leads to an amplified complexity and significance for device and system-level control schemes to maintain resiliency, reliability, and operational stability. Recently, in various fields of … [Read more...] about Towards Intelligent Power Electronics-Dominated Grid via Machine Learning Techniques

Enabling Data-Driven Condition Monitoring of Power Electronic Systems With Artificial Intelligence: Concepts, Tools, and Developments

March 1, 2021 by Shuai Zhao, Huai Wang

Image of a chip with blue squares.

Condition monitoring is a proactive measure to conditions, degradation level, remaining useful lifetime realize operation optimization, predictive maintenance, and high availability of Power Electronic Systems (PES). It is demanded by reliability-, safety-, or availability-critical applications. The core of condition monitoring is a prediction based on historical and present … [Read more...] about Enabling Data-Driven Condition Monitoring of Power Electronic Systems With Artificial Intelligence: Concepts, Tools, and Developments

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To educate, inform, and entertain our community of IEEE Power Electronics Society members on technology, events, industry news, and general topics relating to consumer electronics and to further serve and support our Members in professional career development through tutorials and raising awareness of engineering tools and technologies.

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